Development of α/β Surface Contaminated Measurement
Shaohua ZhangInstitute of Nuclear Physics and Chemistry,Mianyang
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ABI
Annotatsiya
A verification device for α/β surface contaminated detector are developed,by which the source-detector distance can be adjust and controlled precisely and different dimension or shape detector can be fitted and the calibration uncertainty can be reduced.An application of the device is brifely introduced and the results show that it satisfy the demand of the verification regulation well.
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