Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Cluster projectile ions used for the SIMS analysis of silicon

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   ABIABI:AkademIndex/2026.other.415083

2. Mass-spectrometric investigation of Ba + –induced fragmentation and possible Ba–carbon association in C 60 thin films

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   ABIABI:AkademIndex/2026.article.051087