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LARGE VALUES OF THE TRANSVERSE M UES OF THE TRANSVERSE MAGNETIC RESISTANCEOF SINGLE CRYSTAL NICKEL FILMS

Samarkand branch of TUIT named after Mukhammad al-Khwarizmi of the Republic of UzbekistanKhudoyor Urinovcandidate of physical and mathematical sciences, docentA K Amonovcandidate of physical and mathematical sciences, docentX A Jumanovcandidate of physical and mathematical sciences, docentIsmet Shevkitovich Mujdibaevcandidate of physical and mathematical sciences, docent, Samarkand branch of TUIT named after Mukhammad al-Khwarizmi

2020en

Ochiq kirish: yoʻq

ABI

Annotatsiya

Background. The anisotropy of the transverse magnetoresistance of single-crystal nickel films was studied in this work. The measurements were carried out on samples whose surface plane coincided with the [001] plane. Studies of the magnetoresistance in a single-crystal nickel film have shown the effect of tensile stresses acting on it from the side of magnesium oxide. The modification of the anisotropy of magnetoreflection of a film on a substrate as compared to a free sample is apparently associated with a change in the shape of the Fermi surface of carriers.

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DOI: 10.52297/2181-1466/2020/4/5/3

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