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Enhanced Stability through Efficient Suppression of Iodine Oxidation Pathways in CsFAMA Perovskite Solar Cells via Thiourea‐Based Molecule

Ilhom BoynazarovTashkent State Technical University named after Islam Karimov University Street 2 Tashkent 100095 UzbekistanGuangpeng FengState Key Laboratory of Solidification Processing Center for Nano Energy Materials School of Materials Science and Engineering Northwestern Polytechnical University Xi'an 710072 P. R. ChinaSherzod NematovTashkent State Technical University named after Islam Karimov University Street 2 Tashkent 100095 UzbekistanXilai HeState Key Laboratory of Solidification Processing Center for Nano Energy Materials School of Materials Science and Engineering Northwestern Polytechnical University Xi'an 710072 P. R. ChinaXuanhua LiState Key Laboratory of Solidification Processing Center for Nano Energy Materials School of Materials Science and Engineering Northwestern Polytechnical University Xi'an 710072 P. R. ChinaIlhom TojiboyevInstitute of Ion‐Plasma and Laser Technologies named after U. A. Arifov of the Academy of Sciences of the Republic of Uzbekistan Durmon Yuli Street 33 Tashkent 100125 Uzbekistan
Energy Technologyjournal2025en

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Perovskite solar cells (PSCs) exhibit remarkable efficiency but face serious stability challenges due to defects and environmental stresses such as oxygen and moisture. This study introduces enhancing the stability and performance of triple‐cation CsFAMA‐based PSCs through 4‐(Carbamothioylamino)phenylthiourea (CPTU), which is a thiourea derivative with diverse functional groups. CPTU's sulfur and amino groups passivate surface and bulk defects, suppress iodide oxidation, and mitigate superoxidation‐induced degradation, thus improving the passivation mechanism and reducing photodegradation. In this work, CPTU is incorporated into the perovskite active layer via additive engineering. Compared to control devices (without CPTU), the CPTU‐treated PSCs showed improved photovoltaic performance, with power conversion efficiency (PCE) increasing from 20.74% to 22.97%. Long‐term stability tests under continuous illumination (45 °C) demonstrated that CPTU‐based devices retained 92% of their initial PCE after 500 h (vs. 69% for control devices) and 84% after 1000 h. These results highlight CPTU's role in defect passivation and oxidation suppression.

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