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Ish: FTIR SPECTRUM ANALYSIS OF SILICON DOPED WITH ERBIUM
Electrophysical properties of silicon doped with lutetium
Sh.Kh. Daliev, Sharifa B. Utamuradova
MaqolaOchiq kirish20247 iqtibosABIRaman spectroscopy of PtSi formation at the Pt/Si(100) interface
J. C. Tsang, Y. Yokota, R. Matz +1
Maqola19846 iqtibosABIOne and two-phonon Raman scattering from nanostructured silicon
Igor Iatsunskyi, Grzegorz Nowaczyk, Stefan Jurga +3
MaqolaOchiq kirish20155 iqtibosABIDetermining the material structure of microcrystalline silicon from Raman spectra
C. Smit, R.A.C.M.M. van Swaaij, H. Donker +3
MaqolaOchiq kirish20035 iqtibosABIThermal conductivity and air-mediated losses in periodic porous silicon membranes at high temperatures
Bartłomiej Graczykowski, Alexandros El Sachat, J. S. Reparaz +7
MaqolaOchiq kirish20173 iqtibosABI