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Characterization of deep defects in CdS/CdTe thin film solar cells using deep level transient spectroscopy

Jorg VersluysDepartment of Solid State Sciences, Ghent University, Krijgslaan 281 S1, B-9000 Gent, BelgiumP. ClauwsDepartment of Solid State Sciences, Ghent University, Krijgslaan 281 S1, B-9000 Gent, BelgiumPeter NolletElectronics and Information Systems (ELIS), Ghent University, St.-Pietersnieuwstraat 41, B-9000 Gent, BelgiumS. DegraveElectronics and Information Systems (ELIS), Ghent University, St.-Pietersnieuwstraat 41, B-9000 Gent, BelgiumM. BurgelmanElectronics and Information Systems (ELIS), Ghent University, St.-Pietersnieuwstraat 41, B-9000 Gent, Belgium

2004en

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DOI: 10.1016/j.tsf.2003.10.137

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