An analysis of cropland mask choice and ancillary data for annual corn yield forecasting using MODIS data
Yang ShaoDepartment of Geography, Virginia Tech, 115 Major Williams Hall, Blacksburg, VA 24061, USAJames B. CampbellDepartment of Geography, Virginia Tech, 115 Major Williams Hall, Blacksburg, VA 24061, USAGregory N. TaffBaojuan ZhengSchool of Geographical Sciences and Urban Planning, Arizona State University, Coor Hall, 5th Floor, Tempe, AZ 85281, USA
2015en
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