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SpemNet: A Cotton Disease and Pest Identification Method Based on Efficient Multi-Scale Attention and Stacking Patch Embedding

Keyuan QiuCollege of Information Science and Technology, Shihezi University, Shihezi 832003, ChinaYingjie ZhangCollege of Information Science and Technology, Shihezi University, Shihezi 832003, ChinaZekai RenCollege of Information Science and Technology, Shihezi University, Shihezi 832003, ChinaMeng LiDepartment of Computer Science, University of York, Heslington YO10 5DD, UKQian WangDepartment of Computer Science, Durham University, Durham DH1 3LE, UKYiqiang FengSchool of Information, Central University of Finance and Economics, Beijing 100081, ChinaFeng ChenCollege of Information Science and Technology, Shihezi University, Shihezi 832003, China
2024en
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We propose a cotton pest and disease recognition method, SpemNet, based on efficient multi-scale attention and stacking patch embedding. By introducing the SPE module and the EMA module, we successfully solve the problems of local feature learning difficulty and insufficient multi-scale feature integration in the traditional Vision Transformer model, which significantly improve the performance and efficiency of the model. In our experiments, we comprehensively validate the SpemNet model on the CottonInsect dataset, and the results show that SpemNet performs well in the cotton pest recognition task, with significant effectiveness and superiority. The SpemNet model excels in key metrics such as precision and F1 score, demonstrating significant potential and superiority in the cotton pest and disease recognition task. This study provides an efficient and reliable solution in the field of cotton pest and disease identification, which is of great theoretical and applied significance.

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