Low-temperature instability of Ti<sub>2</sub>SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

J. ZhangGraduate School of Chinese Academy of Sciences, Beijing, 100039, ChinaB. LiuGraduate School of Chinese Academy of Sciences, Beijing, 100039, ChinaJingyang WangGraduate School of Chinese Academy of Sciences, Beijing, 100039, ChinaYanchun ZhouGraduate School of Chinese Academy of Sciences, Beijing, 100039, China

2009en

Ochiq kirish: yoʻq

ABI

Annotatsiya

Annotatsiya mavjud emas.

Identifikatorlar

DOI: 10.1557/jmr.2009.0012

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