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Exploring thermoelectric properties and stability of half-Heusler PtXSn (X = Zr, Hf) semiconductors: A first principle investigation

Shakeel Ahmad KhandyDepartment of Physics, National Taiwan University-Taipei, 10617, TaiwanKulwinder KaurDepartment of Applied Sciences, Punjab Engineering College (Deemed to be University), Chandigarh, 160012, IndiaShobhna DhimanDepartment of Applied Sciences, Punjab Engineering College (Deemed to be University), Chandigarh, 160012, IndiaJaspal SinghVipin KumarDepartment of Applied Physics, S. V. National Institute of Technology, Surat 395007, India

2020en

Ochiq kirish: yoʻq

ABI

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Annotatsiya mavjud emas.

Identifikatorlar

DOI: 10.1016/j.commatsci.2020.110232

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