A novel non-uniformity evaluation metric of infrared imaging system
Xiubao SuiSchool of Electronic Engineering and Optoelectronic Technology, NUST, Nanjing 210094, ChinaQian ChenSchool of Electronic Engineering and Optoelectronic Technology, NUST, Nanjing 210094, ChinaGuohua GuSchool of Electronic Engineering and Optoelectronic Technology, NUST, Nanjing 210094, China
2013en
ABI
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