Shallow acceptor levels in 4H- and 6H-SiC

S. R. SmithUniversity of Dayton Research Institute, 300 College Park, 45469-0178, Dayton, OHA. O. EvwarayeMaterials Directorate, Air Force Research Laboratory, AFRL/MLPO, 45433-7707, Wright-Patterson Air Force Base, OHW. C. MitchelDepartment of Physics, University of Dayton, 300 College Park, 45469-2314, Dayton, OHM. A. CapanoMaterials Directorate, Air Force Research Laboratory, AFRL/MLPO, 45433-7707, Wright-Patterson Air Force Base, OH

1999en

ABI

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Annotatsiya mavjud emas.

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DOI: 10.1007/s11664-999-0012-3

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