Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Surface Mass Spectrometry at the Submicrometer Scale

1. Secondary ion emission under the bombardment of Si by multiply charged Si q+ ions

   С. Н. Морозов

   MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20123 iqtibos

   ABIABI:AkademIndex/2012.article.000100

2. Cluster projectile ions used for the SIMS analysis of silicon

   Sh.Dj. Akhunov, С. Н. Морозов

   MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20132 iqtibos

   ABIABI:AkademIndex/2013.article.000207