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Ish: EMF of Hot Charge Carriers Arising at the p-n-Junction under the Influence of the Microwave Field and Light

1. Influence of deformation and light on the diffusion capacity and differential resistance of the p-n junction of a strong electromagnetic field

   G. Gulyamov, M. G. Dadamirzayev, M. O. Qosimova +1

   MaqolaSilicon and Solar Cell TechnologiesAIP conference proceedings20235 iqtibos

   ABIABI:AkademIndex/2026.other.338275

2. Process monitoring of devil machine electric engine in cotton primary processing enterprises

   Erkin Sharibaev, Olimjon Sarimsakov, Raximjon Sharifbaev

   MaqolaAgricultural Engineering and MechanizationAIP conference proceedings20233 iqtibos

   ABIABI:AkademIndex/2026.other.428401

3. Influence of Temperature on Characteristics of a Diode with a p-n Junction in a Magnetic Field

   G. Gulyamov, Gulnoza Majidova, Saodat Madumarova +1

   MaqolaOAOchiq kirishAdvanced Research in Systems and Signal Processinge-Journal of Surface Science and Nanotechnology20240 iqtibos

   ABIABI:AkademIndex/2024.article.007435