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Temperature dependence of the nonequilibrium field penetration depth in a superconductor

V. M. DmitrievPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSRE. V. KhristenkoPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR
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Measurements are reported on the temperature dependence of the step structure in the current–voltage curves for long narrow tin films. Measurements have been made of the temperature dependence of the penetration depth δE for nonequilibrium longitudinal electric fields, which defines the quasinormal N region in the S–N current stratification. It is shown that inelastic and elastic collision mechanisms are important, and the predominant one is determined by the difference between the actual temperature T and the critical temperature Tc. An expression is derived that describes closely the observed dependence of δE on the temperature and the specimen parameters. The inelastic relaxation time is estimated as 8·10–10 sec.

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