Anomalous transparency of thin metal films in the radio frequency range
V. G. Peschanskiı̆Physicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kov and A. M. Gor’kii State University, Khar’kovK. YasemidisPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kov and A. M. Gor’kii State University, Khar’kov
ABI
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It is demonstrated that in a magnetic field parallel to the surface of a thin metal film Umklapp processes occuring during specular reflection of charge carriers on the specimen boundary lead to a generation of an rf field spike in the depths of the metal, the intensity of which is of the same order of magnitude as that of the electromagnetic field in the skin layer. An additional series of rf size effect lines permits observation of Umklapp processes and determination of their probability.
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