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Anomalous transparency of the metal–dielectric interface during thermal emission of phonons by thin metal films

V. G. VolotskayaPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kovV. A. ShklovskiǐPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kovL. E. MusienkoPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kov

Soviet Journal of Low Temperature Physicsjournal1980en

ABI

Annotatsiya

We report measurements of the thermal resistivity of the metal–dielectric interface for tin films in good thermal contact with a single-crystal quartz substrate. There is an anomalous increase in the transparency of the interface at Te ≲ 10 °K. We discuss the possible causes of this increase.

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Mavzular

Mechanical and Optical Resonators Semiconductor Quantum Structures and Devices Thermography and Photoacoustic Techniques

Identifikatorlar

DOI: 10.1063/10.0030122

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