Film of helium He-II on the surface of solid hydrogen
R. I. ShcherbachenkoPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kovS. I. GordeevPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kovB.N. Esel'sonPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kovV. G. IvantsovPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kovYu. Z. KovdryaPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kov
ABI
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The transfer velocity of helium He-II films on the surface of solid parahydrogen was measured at temperatures from 1.4 °K to Tλ. It has been found that the temperature dependence of the transfer velocity follows the same trend here as on a glass substrate, while the absolute values of this velocity are approximately half as large. These results are explained by a reduction of film thickness due to a weaker Van der Waals interaction between liquid helium and solid hydrogen.
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