Transverse electron focusing in metal bicrystals

The possibility of using the method of transverse electron focusing to investigate the nature of conduction electron interaction with crystallite interfaces (CI) is examined theoretically. It is shown that if the reflection coefficient of charges by the intercrystallite face P is small, then focusing lines appear, shaped by the electrons that intersect the CI during their motion. The dependence of the coefficient P on the momentum of the incident electron can result in additional potential singularities at the measuring contact during magnetic field changes. The location of the focusing lines yield information about the degree of mutual orientation of the contiguous crystallites.

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