Critical magnetic fields of thin cold-deposited indium films

The dependence of Hc⊥ on the resistivity has been studied for the first time in freshly deposited thin (< 200 Å) indium films evaporated onto a cold substrate. The films were formed under identical conditions and had similar lattice defects. The critical transverse magnetic field for the thinnest (24 Å) indium films studied was more than 20 times the known values of the fields. The maximum critical transverse magnetic field of freshly evaporated indium films, according to the experimental data, was 72,000 Oe (Hc⊥≈1.6 · 104Tc), which is near the paramagnetic limit.

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