Reflectivity and Transmittivity of a Stack of Thin Films in the Soft X-ray Region
O. Litzmana Department of Theoretical Physics and Astrophysics, Faculty of Science of UJEP, 611 37 Brno, CzechoslovakiaP. Rózsab Department of Mathematics, Faculty of Electrical Engineering, Technical University, Budapest, Hungary
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Formulae are presented for the S-polarized complex reflectivity and transmittivity of a stack of dielectric films, valid in the soft X-ray region and based on the Ewald microscopical model of a dielectric. These formulae are compared with the classical Fresnel formulae and the results of model calculations are presented.
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