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Range of existence of the low-temperature phases in cold-deposited sodium films

V. S. KupreĩchenkoPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, KharkovA. A. MoshenskiĭPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, KharkovM. SpasovaPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov

Soviet Journal of Low Temperature Physicsjournal1986en

ABI

Annotatsiya

The temperature dependences of the electrical resistivity of thin (d = 100−1000 Å) cold-deposited sodium films have been investigated. Anomalies were found in the R(T) relation for films of thickness d &lt; 750 Å in the temperature range up to 100 °K. Comparison of the anomalies in R(T) with results of structural investigations enabled a qualitative model to be constructed of the structural transformation processes which take place on annealing cold-deposited Na films.

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Identifikatorlar

DOI: 10.1063/10.0031440

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