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Ish: Photodeflection and photoacoustic microscopy of cracks and residual stresses induced by Vickers indentation in silicon nitride ceramic

1. Scanning electron acoustic microscopy of indentation-induced cracks and residual stresses in ceramics

   John H. Cantrell, Menglu Qian, M. Ravichandran +1

   Maqola19902 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.488435

2. Sarlavhasiz

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   ABIABI:AkademIndex/openalex/2026.other.488441

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   ABIABI:AkademIndex/openalex/2026.other.488430

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   ABIABI:AkademIndex/openalex/2026.other.488431

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   ABIABI:AkademIndex/openalex/2026.other.488432

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   ABIABI:AkademIndex/openalex/2026.other.488433

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   ABIABI:AkademIndex/openalex/2026.other.488434

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   ABIABI:AkademIndex/openalex/2026.other.488436

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   ABIABI:AkademIndex/openalex/2026.other.488437

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    ABIABI:AkademIndex/openalex/2026.other.488438

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    ABIABI:AkademIndex/openalex/2026.other.488439

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    ABIABI:AkademIndex/openalex/2026.other.488440