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Investigation of transient processes in YBaCuO films by low-temperature scanning electron microscopy

V. A. Solov#x2019;evA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgM. É. GaevskiiA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgS. G. KonnikovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgR. A. SurisA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgA. V. Bobyl
Technical Physics Lettersjournal1997en
ABI

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It has been observed that the inhomogeneity of high-temperature superconducting films influences its temporal characteristics under the local action of electron probe pulses. The proposed method of time-resolved, low-temperature scanning electron microscopy is the first step in this direction. For the first time local investigations with a time resolution of 1 ns have been made of the influence of weak bonds during switching from the superconducting to the normal state and back, under local heating by an electron probe. It was shown that for a YBa2Cu3O7−x film 400 nm thick at T=80 K, the thermal diffusion time is between 400 and 600 ns depending on the parameters of the film and substrate sections adjacent to the point under study.

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