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Semiconductor Fatigue-Damage Indicator

М. К. КарабаевTashkent State Medical Institute, Tashkent, UzbekistanK. É. OnarkulovFergana State University, Fergana, UzbekistanM. M. AkhmedovFergana State University, Fergana, UzbekistanD. A. YusupovaFergana State University, Fergana, Uzbekistan
Journal of Engineering Physics and Thermophysicsjournal2002en
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Material Properties and ApplicationsEngineering Diagnostics and ReliabilityPolymer Science and Applications

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DOI
10.1023/a:1021148515440

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