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Application of X-ray fluorescence for the analysis of some technological materials

N. M. MukhamedshinaInstitute of Nuclear Physics, Ulugbek, Tashkent 702132, Uzbekistan. [email protected]A. A. MirsagatovaInstitute of Nuclear Physics, Ulugbek, Tashkent 702132, Uzbekistan
Applied Radiation and Isotopesjournal2005en
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Mavzular

Nuclear Physics and ApplicationsX-ray Spectroscopy and Fluorescence AnalysisX-ray Diffraction in Crystallography

Identifikatorlar

DOI
10.1016/j.apradiso.2005.05.034

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