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2 ta ish
Ish: Investigation of profiles of the distribution of ion-implanted Mn atoms using the rutherford back scattering method and the influence of thermal annealing on them
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AkademBasetez oradaEkotizim uchun ochiq APISarlavha, annotatsiya va ismlar qaysi yozuvda koʻrsatilsin
2 ta ish
Ish: Investigation of profiles of the distribution of ion-implanted Mn atoms using the rutherford back scattering method and the influence of thermal annealing on them