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28 ta ish
Ish: Hierarchical film formation and structural characterization using MeV-ion beams
A comprehensive review of ZnO materials and devices
Ümit Özgür, Ya. I. Alivov, C. Liu +6
Sharh maqola200535 iqtibosABISimulated annealing analysis of Rutherford backscattering data
N.P. Barradas, C. Jeynes, R.P. Webb
Maqola19975 iqtibosABIFriction and wear properties of TiN, TiAlN, AlTiN and CrAlN PVD nitride coatings
Liu Aihua, Deng Jianxin, Cui Haibing +2
Maqola20112 iqtibosABIOptimization and thermal stability of TiAlN/Mo multilayers
Carlos J. Tavares, C. Vidrago, L. Rebouta +3
Maqola20052 iqtibosABI