The effect of cycle deformation on the AC conductivity of (Bi0.3Sb0.7)2Te3 films

Annotatsiya

It has been found that the resistance of the (Bi0.3Sb0.7)2Te3 porous polycrystalline film fabricated by thermal vacuum evaporation at substrate temperature T s ≤ 363 K drastically decreases near the threshold AC frequency ω0 ≈ 105 Hz as low as the resistance of dense films with T s ≈ 423 K. After the action of N ≈ 105 cycles of mechanical deformation with amplitude ε = ±1 × 10–3 a.u., the film resistance increases by 1.5 times and the threshold frequency decreases in almost 102 times, which can qualitatively be accounted for by the model of microcontacting blocks.

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Identifikatorlar

DOI

10.1134/s1063784217030227

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