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Ish: Influence of frequency and bias voltage on dielectric properties and electrical conductivity of Al/TiO<sub>2</sub>/p-Si/p<sup>+</sup>(MOS) structures
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Ish: Influence of frequency and bias voltage on dielectric properties and electrical conductivity of Al/TiO<sub>2</sub>/p-Si/p<sup>+</sup>(MOS) structures