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Electrowetting-on-dielectric characteristics of ZnO nanorods

Jae‐Hun KimDepartment of Materials Science and Engineering, Inha University, Incheon, 22212, Republic of KoreaJae‐Hyoung LeeDepartment of Materials Science and Engineering, Inha University, Incheon, 22212, Republic of KoreaAli MirzaeiDepartment of Materials Science and Engineering, Shiraz University of Technology, 71557-13876, Shiraz, IranHyoun Woo KimDivision of Materials Science and Engineering, Hanyang University, Seoul, 04763, Republic of Korea. [email protected]Boon Teoh TanEntropic Interface Group, Singapore University of Technology and Design, Singapore, 487372, SingaporePing WuEntropic Interface Group, Singapore University of Technology and Design, Singapore, 487372, Singapore. [email protected]Sang Sub KimDepartment of Materials Science and Engineering, Inha University, Incheon, 22212, Republic of Korea. [email protected]

2020en

ABI

Annotatsiya

Abstract Herein, we report the electrowetting-on-dielectric (EWOD) characteristics of ZnO nanorods (NRs) prepared via the hydrothermal method with different initial Zn 2+ concentrations (0.03, 0.07, and 0.1 M). Diameter of the resultant ZnO NRs were 50, 70 and 85 nm, respectively. Contact angle (CA) measurements showed that the Teflon-coated ZnO NRs with diameters of 85 nm prepared from the 0.1 M solution had the highest CA (137°). During the EWOD studies, on the application of a voltage of 250 V, the water CA decreased to 78°, which demonstrates the potential application of this material in EWOD electronics. Furthermore, we explained the relationship between the applied voltage and CA based on the substrate nanostructures and our newly developed NR-on-film wetting model. In addition, we further validated our model by introducing the homo-composite dielectric structure, which is a composite of thin layered ZnO/Teflon and nano-roded ZnO/Teflon.

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DOI: 10.1038/s41598-020-71017-7

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