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INVESTIGATION OF THE INFLUENCE OF FINITE APERTURE SIZE ON THE Z-SCAN TRANSMITTANCE CURVE

Xiaodong LiuNational Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, ChinaShengli GuoNational Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, ChinaHui‐Tian WangNational Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, ChinaNai‐Ben MingNational Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, ChinaLantian HouInstitute of Infrared Optical Fibers and Sensors, Yanshan University, Qinhuangdao 066004, China

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ABI

Annotatsiya

For the nonlinear materials, not only the ratio ρ of the imaginary to the real part of the third-order nonlinear susceptibility but also the finite aperture size S exert a great influence upon the appearance of a peak on the Z-scan transmittance curve. This article investigates the ρ dependence of the critical aperture size S c , which determines whether a transmittance peak occurs or not, and the dependence of the critical value ρ c on the parameter S for the thin-sample and low irradiance limits with a Gaussian beam. These results may be applied to the adjustment of experimental conditions at all times and the assessment of the correctness of data analysis. The experiment with CS 2 seeking the critical value S c has verified above results.

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DOI: 10.1142/s0218863501000747

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