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The Einstein Observatory Extended Medium-Sensitivity Survey. I - X-ray data and analysis

I. M. GioiaHarvard Smithsonian Center for Astrophysics, Cambridge, MA, United StatesT. MaccacaroRudolph E. SchildA. WolterJohn T. StockeColorado, University Boulder, United StatesS. L. MorrisJ. P. Henry
1990en
ABI

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This paper presents the results of the analysis of the X-ray data and the optical identification for the Einstein Observatory Extended Medium-Sensitivity Survey (EMSS). The survey consists of 835 serendipitous sources detected at or above 4 times the rms level in 1435 imaging proportional counter fields with centers located away from the Galactic plane. Their limiting sensitivities are about (5-300) x 10 to the -14th ergs/sq cm sec in the 0.3-3.5-keV energy band. A total area of 778 square deg of the high-Galactic-latitude sky has been covered. The data have been analyzed using the REV1 processing system, which takes into account the nonuniformities of the detector. The resulting EMSS catalog of X-ray sources is a flux-limited and homogeneous sample of astronomical objects that can be used for statistical studies.

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