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Bound exciton and donor–acceptor pair recombinations in ZnO

Bertrand MeyerI. Physics Institute, Justus Liebig University Giessen, Heinrich-Buff-Ring 16, 35392 Giessen, GermanyH. AlvesI. Physics Institute, Justus Liebig University Giessen, Heinrich-Buff-Ring 16, 35392 Giessen, GermanyD.M. HofmannI. Physics Institute, Justus Liebig University Giessen, Heinrich-Buff-Ring 16, 35392 Giessen, GermanyW. KriegseisI. Physics Institute, Justus Liebig University Giessen, Heinrich-Buff-Ring 16, 35392 Giessen, GermanyDaniel F. FörsterOtto-von-Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, GermanyF. BertramOtto-von-Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, GermanyJ. ChristenOtto-von-Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, GermanyA. HoffmannTechnical University Berlin, Solid State Physics Institute, Hardenbergstr. 36, 10623 Berlin, GermanyMartin StraßburgTechnical University Berlin, Solid State Physics Institute, Hardenbergstr. 36, 10623 Berlin, GermanyM. DworzakTechnical University Berlin, Solid State Physics Institute, Hardenbergstr. 36, 10623 Berlin, GermanyU. HaboeckTechnical University Berlin, Solid State Physics Institute, Hardenbergstr. 36, 10623 Berlin, GermanyA. V. RodinaA.F. Ioffe Physico-Technical Institute, RAS, 194021 St. Petersburg, Russia
2004en
ABI

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Abstract The optical properties of excitonic recombinations in bulk, n‐type ZnO are investigated by photoluminescence (PL) and spatially resolved cathodoluminescence (CL) measurements. At liquid helium temperature in undoped crystals the neutral donor bound excitons dominate in the PL spectrum. Two electron satellite transitions (TES) of the donor bound excitons allow to determine the donor binding energies ranging from 46 to 73 meV. These results are in line with the temperature dependent Hall effect measurements. In the as‐grown crystals a shallow donor with an activation energy of 30 meV controls the conductivity. Annealing annihilates this shallow donor which has a bound exciton recombination at 3.3628 eV. Correlated by magnetic resonance experiments we attribute this particular donor to hydrogen. The Al, Ga and In donor bound exciton recombinations are identified based on doping and diffusion experiments and using secondary ion mass spectroscopy. We give a special focus on the recombination around 3.333 eV, i.e. about 50 meV below the free exciton transition. From temperature dependent measurements one obtains a small thermal activation energy for the quenching of the luminescence of 10 ± 2 meV despite the large localization energy of 50 meV. Spatially resolved CL measurements show that the 3.333 eV lines are particularly strong at crystal irregularities and occur only at certain spots hence are not homogeneously distributed within the crystal contrary to the bound exciton recombinations. We attribute them to excitons bound to structural defects (Y‐line defect) very common in II–VI semiconductors. For the bound exciton lines which seem to be correlated with Li and Na doping we offer a different interpretation. Li and Na do not introduce any shallow acceptor level in ZnO which otherwise should show up in donor–acceptor pair recombinations. Nitrogen creates a shallow acceptor level in ZnO. Donor–acceptor pair recombination with the 165 meV deep N‐acceptor is found in nitrogen doped and implanted ZnO samples, respectively. In the best undoped samples excited rotational states of the donor bound excitons can be seen in low temperature PL measurements. At higher temperatures we also see the appearance of the excitons bound to the B‐valence band, which are approximately 4.7 meV higher in energy. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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