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Influence of ion implantation and electron pre-irradiation on charging of dielectrics under electron beam irradiation: Application to SiO2

Э. И. РауLomonosov Moscow State University, 119991 Moscow, RussiaA. A. TatarintsevLomonosov Moscow State University, 119991 Moscow, RussiaE. Yu. ZykovaLomonosov Moscow State University, 119991 Moscow, Russia
2019en
ABI

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