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Influence of the Temperature and Cyclic Deformations of (BixSb1–x)2Te3 Films on Their Resistance

Kh.S. DalievInstitute of Semiconductor Physics and Microelectronics, National University of Uzbekistan, 20 Yangi Alma-zar Str., Tashkent, Uzbekistan, 100057M. M. AhmedovFergana State University, 19 Murabbiylar Str., Fergana, Uzbekistan, 150100M. K. OnarkulovFergana State University, 19 Murabbiylar Str., Fergana, Uzbekistan, 150100

Journal of Engineering Physics and Thermophysicsjournal2021en

ABI

Annotatsiya

Annotatsiya mavjud emas.

Mavzular

Advanced Thermoelectric Materials and Devices Phase-change materials and chalcogenides Advanced Semiconductor Detectors and Materials

Identifikatorlar

DOI: 10.1007/s10891-021-02419-1

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