Micro-scanning system using flat optics for resolution improvement of infrared images
Xiubao SuiSchool of Electronic Engineering and Optoelectronic Technology, NUST, Nanjing 210094, ChinaQian ChenSchool of Electronic Engineering and Optoelectronic Technology, NUST, Nanjing 210094, ChinaGuohua GuSchool of Electronic Engineering and Optoelectronic Technology, NUST, Nanjing 210094, China
2012en
ABI
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