X-ray diffraction study of the crystallographic characteristics of TlInS x Se2 − x solid solutions
А. У. ШелегScientific-Practical Materials Research Centre of the National Academy of Sciences of Belarus, Minsk, BelarusV. G. HurtavyScientific-Practical Materials Research Centre of the National Academy of Sciences of Belarus, Minsk, BelarusViktoryia ShautsovaScientific-Practical Materials Research Centre of the National Academy of Sciences of Belarus, Minsk, BelarusV. A. AlievInstitute of Physics, Academy of Sciences of Azerbaijan, Baku, Az-1143, Azerbaijan
2014en
ABI
Annotatsiya
Crystallographic parameters of TlInS x Se2 − x solid solutions have been measured by X-ray diffraction. Dependences of the unit-cell parameters on the composition are determined. It is established that the values of parameters a, b, and c and the angle β decrease with an increase in x. It is shown that the TlInS x Se2 − x system includes a continuous series of solid solutions based on the TlInSe2 compound with tetragonal symmetry at x values ≤ 0.4, while at x ≥ 0.6 solid solutions based on the TlInS2 compound with a monoclinic structure are formed.
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