Maqola

On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study

Michael NiehlePaul-Drude-Institut für Festkörperphysik, Hausvogteiplatz 5-7, 10117 Berlin, GermanyJean‐Baptiste RodriguezCNRS, IES, UMR 5214, F-34000 Montpellier, FranceL. CeruttiCNRS, IES, UMR 5214, F-34000 Montpellier, FranceE. TourniéCNRS, IES, UMR 5214, F-34000 Montpellier, FranceA. TrampertPaul-Drude-Institut für Festkörperphysik, Hausvogteiplatz 5-7, 10117 Berlin, Germany

2017en

ABI

Annotatsiya

Annotatsiya mavjud emas.

Identifikatorlar

DOI: 10.1016/j.actamat.2017.09.055

Iqtiboslar va manbalar

2 ta iqtibos0 ta foydalanilgan manba

Koʻrsatkichlar — AkademScholar