Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20 nm modern integrated circuits
Woojin AhnSchool of ECE, Purdue University, West Lafayette, IN 47907, USASangHoon ShinSchool of ECE, Purdue University, West Lafayette, IN 47907, USAChang‐Ming JiangSchool of ECE, Purdue University, West Lafayette, IN 47907, USAHai JiangSchool of ECE, Purdue University, West Lafayette, IN 47907, USAM. A. WahabSchool of ECE, Purdue University, West Lafayette, IN 47907, USAM. A. AlamSchool of ECE, Purdue University, West Lafayette, IN 47907, USA
2018en
ABI
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