Maqola

Method for system-independent material characterization from spectral X-ray CT

Matteo BusiLawrence Livermore National Laboratory, Livermore, CA, 94551, USAK. Aditya MohanLawrence Livermore National Laboratory, Livermore, CA, 94551, USAAlex A. DooraghiLawrence Livermore National Laboratory, Livermore, CA, 94551, USAKyle ChampleyLawrence Livermore National Laboratory, Livermore, CA, 94551, USAH.E. MartzLawrence Livermore National Laboratory, Livermore, CA, 94551, USAUlrik L. OlsenTechnical University of Denmark, DTU Physics, 2800, Kgs. Lyngby, Denmark

2019en

ABI

Annotatsiya

Annotatsiya mavjud emas.

Identifikatorlar

DOI: 10.1016/j.ndteint.2019.102136

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