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Ish: Post-Annealing Effects on Fixed Charge and Slow/Fast Interface States of TiN/Al<sub>2</sub>O<sub>3</sub>/p-Si Metal–Oxide–Semiconductor Capacitor
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Ish: Post-Annealing Effects on Fixed Charge and Slow/Fast Interface States of TiN/Al<sub>2</sub>O<sub>3</sub>/p-Si Metal–Oxide–Semiconductor Capacitor