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Ish: Formation of High-Mass Cluster Ions from Compound Semiconductors Using Time-of-Flight Secondary Ion Mass Spectrometry with Cluster Primary Ions

1. Sputtering of GaAs target under Bi+ cluster ions bombardment

   Sh.Dj. Akhunov, G.P. Kakhramonova, Sh.M. Axmedov +2

   MaqolaIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20221 iqtibos

   ABIABI:AkademIndex/openalex/2022.article.000824

2. Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

   Guliston Kakhamonova, Sh.Dj. Akhunov, Makhmanazar M. Nazarov +2

   MaqolaIon-surface interactions and analysisSurface and Interface Analysis20240 iqtibos

   ABIABI:AkademIndex/openalex/2024.article.008231