Maqola

Effect of ion irradiation on the depth profiles of microdefects in silicon

Е. С. ДемидовLobachevski State University, pr. Gagarina 23, 603600, Nizhni Novgorod, RussiaN. D. LatyshevaLobachevski State University, pr. Gagarina 23, 603600, Nizhni Novgorod, RussiaV. A. PerevoshchikovLobachevski State University, pr. Gagarina 23, 603600, Nizhni Novgorod, RussiaА. В. СкуповLobachevski State University, pr. Gagarina 23, 603600, Nizhni Novgorod, RussiaV. D. SkupovLobachevski State University, pr. Gagarina 23, 603600, Nizhni Novgorod, Russia

2000en

ABI

Annotatsiya

Annotatsiya mavjud emas.

Identifikatorlar

DOI: 10.1007/bf02758038

Iqtiboslar va manbalar

2 ta iqtibos0 ta foydalanilgan manba

Koʻrsatkichlar — AkademScholar