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Ish: Combined Influence of Gate Oxide and Back Oxide Materials on Self-Heating and DIBL Effect in 2D MOS2-Based MOSFETs

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   ABIABI:AkademIndex/openalex/2026.other.511881

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   ABIABI:AkademIndex/openalex/2026.other.511882

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   ABIABI:AkademIndex/openalex/2026.other.511883

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   ABIABI:AkademIndex/openalex/2026.other.511886