Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage
А. S. KomolovResearch Institute for Physics, St. Petersburg State University, Uljanovskaja ul.1, St. Petersburg, Russian FederationKjeld SchaumburgCISMI, Department of Chemistry, University of Copenhagen, Fruebjergvej 3, DK-2100, Copenhagen, DenmarkPreben J. MøllerChemical Laboratory IV, Department of Chemistry, University of Copenhagen, Universitetsparken 5, DK-2100, Copenhagen, DenmarkВ. В. МонаховResearch Institute for Physics, St. Petersburg State University, Uljanovskaja ul.1, St. Petersburg, Russian Federation
1999en
ABI
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