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Electromagnetic Shielding of Monolayer MXene Assemblies

Taeyeong YunNational Creative Research Initiative Centre for Multi‐Dimensional Directed Nanoscale Assembly Department of Materials Science and Engineering KAIST Institute for Nanocentury Daejeon 34141 KoreaHyerim KimKU‐KIST Graduate School of Converging Science and Technology Korea University Seoul 02841 KoreaAamir IqbalDivision of Nano and Information Technology KIST School University of Science and Technology Daejeon 34113 KoreaYong Soo ChoKU‐KIST Graduate School of Converging Science and Technology Korea University Seoul 02841 KoreaGang San LeeNational Creative Research Initiative Centre for Multi‐Dimensional Directed Nanoscale Assembly Department of Materials Science and Engineering KAIST Institute for Nanocentury Daejeon 34141 KoreaMyung‐Ki KimKU‐KIST Graduate School of Converging Science and Technology Korea University Seoul 02841 KoreaSeon Joon KimDepartment of Materials Science and Engineering, and A. J. Drexel Nanomaterials Institute Drexel University Philadelphia PA 19104 USADaesin KimKU‐KIST Graduate School of Converging Science and Technology Korea University Seoul 02841 KoreaYury GogotsiDepartment of Materials Science and Engineering, and A. J. Drexel Nanomaterials Institute Drexel University Philadelphia PA 19104 USASang Ouk KimDepartment of Materials Science and Engineering, and A. J. Drexel Nanomaterials Institute Drexel University Philadelphia PA 19104 USAChong Min KooDivision of Nano and Information Technology KIST School University of Science and Technology Daejeon 34113 Korea

2020en

ABI

Annotatsiya

Abstract Miniaturization of electronics demands electromagnetic interference (EMI) shielding of nanoscale dimension. The authors report a systematic exploration of EMI shielding behavior of 2D Ti 3 C 2 T x MXene assembled films over a broad range of film thicknesses, monolayer by monolayer. Theoretical models are used to explain the shielding mechanism below skin depth, where multiple reflection becomes significant, along with the surface reflection and bulk absorption of electromagnetic radiation. While a monolayer assembled film offers ≈20% shielding of electromagnetic waves, a 24‐layer film of ≈55 nm thickness demonstrates 99% shielding (20 dB), revealing an extraordinarily large absolute shielding effectiveness (3.89 × 10 6 dB cm 2 g −1 ). This remarkable performance of nanometer‐thin solution processable MXene proposes a paradigm shift in shielding of lightweight, portable, and compact next‐generation electronic devices.

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Identifikatorlar

DOI: 10.1002/adma.201906769

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