Structural properties of ZnO:Al films produced by the sol–gel technique
E. P. ZaretskayaScientific and Practical Materials Research Center, National Academy of Sciences of Belarus, Minsk, 220072, BelarusВ. Ф. ГременокScientific and Practical Materials Research Center, National Academy of Sciences of Belarus, Minsk, 220072, BelarusА. В. СемченкоGomel State University, Gomel, 246699, BelarusV. V. SidskyGomel State University, Gomel, 246699, BelarusRemigijus JuškėnasState Research Institute Center for Physical Sciences and Technology, Vilnius, LT-01108, Lithuania
2015en
ABI
Annotatsiya
ZnO:Al films are produced by sol–gel deposition at temperatures of 350–550°C, using different types of reagents. Atomic-force microscopy, X-ray diffraction analysis, Raman spectroscopy, and optical transmittance measurements are used to study the dependence of the structural, morphological, and optical properties of the ZnO:Al coatings on the conditions of deposition. The optical conditions for the production of ZnO:Al layers with preferred orientation in the [001] direction and distinguished by small surface roughness are established. The layers produced in the study possess optical transmittance at a level of up to 95% in a wide spectral range and can be used in optoelectronic devices.
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