Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Crystallite size determination in μc-Ge films by x-ray diffraction and Raman line profile analysis

1. Defective Structure of Silicon Doped with Dysprosium

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   ABIABI:AkademIndex/openalex/2026.other.412289

2. Changes in the Structure and Properties of Silicon During Ytterbium Doping: The Results of o Comprehensive Analysis

   Kh.S. Daliev, Sharifa B. Utamuradova, Jonibek J. Khamdamov +3

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   ABIABI:AkademIndex/openalex/2026.other.432368