Ferromagnetic resonance, magnetic properties, and resistivity of (CoFeZr) x (Al2O3)1 − x /Si multilayer nanostructures
С. А. ВызулинKuban State University, Stavropolskaya ul. 149, Krasnodar, 350040, RussiaA. V. GorobinskiiKuban State University, Stavropolskaya ul. 149, Krasnodar, 350040, RussiaYu. E. KalininVoronezh State Technical University, Moskovskii pr. 14, Voronezh, 394026, RussiaE. V. LebedevaMoscow State UniversityА. В. СитниковVoronezh State Technical University, Moskovskii pr. 14, Voronezh, 394026, RussiaН. Е. СырьевMoscow State UniversityI. T. TrofimenkoFaculty of Physics, Moscow State University, Moscow, 119992, RussiaYu. I. ChekryginaNational Technical University “Kharkiv Polytechnic Institute,”, ul. Frunze 21, Kharkiv, 61002, UkraineI. G. ShipkovaNational Technical University “Kharkiv Polytechnic Institute,”, ul. Frunze 21, Kharkiv, 61002, Ukraine
2010en
ABI
Annotatsiya
Comparative investigations of static magnetic properties, magnetoresistance, and ferromagnetic resonance data of multilayer nanostructures consisting of CoFeZr-Al2O3 composite magnetic layers and amorphous silicon semiconductor spacers were performed in a layer thickness range below 5 nm. The influence of layer dimension parameters and chemical peculiarities of silicon on the inner structure and type of magnetic interactions in nanostructures with 35 and 46 at % magnetic phase composite layers is discussed.
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